Dr. Mohamad Alwan

Bias Temperature Instability from Gate Charge characteristics investigations in N-Channel Power MOSFET

10 Avril 2007 , Rédigé par Alwan Publié dans #Article

Publication Bias Temperature Instability from Gate Charge characteristics investigations in N-Channel Power MOSFET Microelectronics Journal 38 (2007) 727–734 M. Alwan, B. Beydoun*, K. Ketata, M. Zoaeter* Laboratoire Electronique Microtechnologie et Instrumentation...

Bi-dimensional Investigation of Thermal Stress Effect on static VDMOS Characteristics

10 Avril 2007 , Rédigé par Alwan Publié dans #Article

Publication Bi-dimensional Investigation of Thermal Stress Effect on static VDMOS Characteristics. Active and Passive Electronic Devices ( J. of Active and Passive Electronic Devices, Vol. 3, 2008 pp. 77–91) B. Beydoun*, M. Alwan, K. Ketata, M. Zoaeter*...