Bi-dimensional Investigation of Thermal Stress Effect on static VDMOS Characteristics

Publication

Bi-dimensional Investigation of Thermal Stress Effect on static VDMOS Characteristics.

Active and Passive Electronic Devices (J. of Active and Passive Electronic Devices, Vol. 3, 2008 pp. 77–91)

 B. Beydoun^*, M. Alwan, K. Ketata, M. Zoaeter^*

 Laboratoire Electronique Microtechnologie et Instrumentation (LEMI), Rouen University,

 76821 Mont Saint Aignan, France.

  ^*Laboratoire de Physique des Matériaux (LPM), Lebanese university, P.O.Box : 11-4661 Beirut -Lebanon